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SPM - Scanning Probe Microscopy

Scanning Probe Microscopy (contact + semi-contact) koji uključuje:
AFM/Lateral Force Microscopy/Phase Imaging/Lithography/STM/Magnetic Force Microscopy/Scanning Capacitance Microscopy/ Kelvin Probe Microscopy/ Spreading Resistance Imaging/
Institut Ruđer Bošković
Bijenička cesta 54
10000
Zagreb
Hrvatska
Nanotehnologija
kapitalna (više od 200 kkn)
dr.sc. Ivana Capan
IRB
capan@irb.hr